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CDE ResMap Resistivity 4-pt Probe

Automatic 4 point probe resitivity mapper

CDE Resitivity Mapper
Manager: Phil Infante
Backup: Aaron Windsor


The CDE resistivity mapper is a 4 point probe system with an automatic stage. It can be used to measure the surface resistivity of thin films or with calibration, the thickness and uniformity of conductive thin films.

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