Button: Contact CNFButton: MultimediaButton: About CNF
Button: Getting StartedButton: PublicationButton: REU ProgramButton: Events & SeminarsButton: Education OutreachButton: TechnologiesButton: Lab Equipment

Button: Lab User


CDE ResMap Resistivity 4-pt Probe

Automatic 4 point probe resitivity mapper

CDE Resitivity Mapper
Manager: Phil Infante
Backup: Aaron Windsor

Description:

The CDE resistivity mapper is a 4 point probe system with an automatic stage. It can be used to measure the surface resistivity of thin films or with calibration, the thickness and uniformity of conductive thin films.




Back to Top




Button: Search Button: Search Keywords
Cornell University
NYSTARNNCINSF