Bruker Energy-dispersive X-ray Spectrometer (EDS)
Modular EDS system for qualitative and quantitative microanalysis.
Manager: Alan R. BleierBackup: Amrita Banerjee , John Treichler
The Bruker QUANTAX 200 Energy Dispersive X- ray Spectrometer (EDS) with XFlash®6 silicon drift detector is a modular EDS system for qualitative and quantitative microanalysis. The system’s standard-less quantification software enables manual, automatic or interactive spectra evaluation and provides reliable results for specimens with polished or irregular surfaces, thin layers and particles. The XFlash® detector is a Silicon Drift Detector (SDD) which needs no liquid nitrogen cooling, provides high throughput rates and light element detection capabilities. The QUANTAX 200 uses the scanning system of the Zeiss Supra SEM, and has line scanning with spectrum-at-every-pixel functionality and also does mapping to produce element images.
Additional Resources:Location of tool in cleanroom (jpg)
Back to Top
This material is based upon work supported by the National Science Foundation under Grant No. NNCI-1542081. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.
If you have a disability and are having trouble accessing information on this website or need materials in an alternate format, contact firstname.lastname@example.org for assistance.
Cornell NanoScale Science & Technology Facility (CNF)
250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700
Voice: 607-255-2329, Fax: 607-255-8601, Email: email@example.com
Powered by ITX