Button: Contact CNFButton: MultimediaButton: About CNF
Button: Getting StartedButton: PublicationButton: REU ProgramButton: Events & SeminarsButton: Education OutreachButton: TechnologiesButton: Lab Equipment

Button: Lab User


Nikon Eclipse L200N and Other Optical Inspection Microscopes

Microscopes for inspection of devices

Olympus MX50 Backup: Garry Bordonaro

Description:

The CNF has many optical microscopes including this Olympus MX50 for inspection of devices. Digital cameras attached to the microscopes are available for taking images of your work.

The Nikon Eclipse L200N microscope and Nikon Elements D image capture software are the best optical microscopy system at CNF.

Features include:

Motorized objective change- permits quick observation changeovers (optional hand switch is available for direct selection of objectives)
A range of observation modes - including brightfield, darkfield, (Nomarski) DIC and polarized light

The MX50 semiconductor inspection microscope was developed specifically to meet the demands of wafer inspection. It is a user-friendly microscope that allows operators to work in an ergonomically correct position and benefit from smoother operation throughout extended inspection periods.

Features include:

Motorized objective change- permits quick observation changeovers (optional hand switch is available for direct selection of objectives)
A range of observation modes - including brightfield, darkfield, (Nomarski) DIC and polarized light
Magnification range- 100x to 2500x




Back to Top




Button: Search Button: Search Keywords
Cornell University
NYSTARNNCINSF